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Checking wafer presence

Checking wafer presence

Our photoelectric sensors with separate electronics use special optics with a small light spot to detect the presence of a wafer or carrier through a viewing aperture. Simply thread the vacuum compatible diffuse sensor with stainless steel housing into your process chamber. The chamber is then sealed and no cable feedthrough is needed.

The features

  • Micro-optics with small light spot
  • Rugged stainless steel housing with sealing function
  • for vacuum applications up to 1 × 10–9 mbar

Downloads

  • Industry brochure semiconductor industry

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Balluff Benelux

Hintham 117d
5246 AE Rosmalen, Netherlands

Please contact us:
[email protected]

Contact us by telephone:
+32 (0)16 792970